Testing inside the fab or packaging house can determine whether a chip or package meets all the functional requirements at time zero, but how that chip behaves in the field during its lifetime and ...

While semiconductor design engineers become more aware of silent data corruption (SDC) or silent data errors (SDE) caused by aging, environmental factors, and other issues, embedded test solutions are ...

Widely available and nearly unlimited compute resources, coupled with the availability of sophisticated algorithms, are opening the door to adaptive testing. But the speed at which this testing ...

Machine learning (ML) is a subset of artificial intelligence (AI) that involves using algorithms and statistical models to enable computer systems to learn from data and improve performance on a ...

Test automation and DevOps play a major role in today's quality assurance landscape. As we know, software development is evolving at a rapid pace. This requires finding robust ways to invest in ...