A different set of fault models and testing techniques is required for memory blocks vs. logic. MBIST algorithms that are used to detect faults inside memory are based upon these fault models. This ...
Should I install an ungrounded, solid, or high-resistance grounding system? That is the question asked by many designers and installers. The answer to this question depends on many factors. To make ...
Schematic view of a typical Smart Cable Guard setup with a monitored cable section spanning multiple RMUs installed in medium-voltage/low-voltage substations. Medium ...
It is well established that transition and stuck-at fault models detect the vast majority of production defects. The transition fault model focuses on detecting timing-related defects. However, the ...
Functional safety is a major challenge for field programmable gate arrays (FPGAs) and other semiconductor designs. Safety requirements go beyond traditional verification, which focuses on design bugs.
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