Cornell researchers have used high-resolution 3D imaging to detect, for the first time, the atomic-scale defects in computer chips that can sabotage their performance. The imaging method, which was ...

A stunning new imaging breakthrough lets scientists see — and fix — the atomic flaws hiding inside tomorrow’s computer chips.

Cornell researchers have used advanced electron microscopy to identify "mouse bite" defects in 3D transistors for the first time ...

Scientists at the Department of Energy's Lawrence Berkeley National Laboratory (Berkeley Lab) have developed a new way to determine atomic structures from nanocrystals previously considered unusable, ...

Transmission electron microscopes (TEMs) allow researchers at the forefront of energy technology to study next-generation ...

Electron microscopy is a powerful technique that provides high-resolution images by focusing a beam of electrons to reveal fine structural details in biological and material specimens. 2 Because ...

The ability of single particle cryo-electron microscopy to capture structural information on samples that could not be crystallized for use with crystallographic methods or were too delicate for ...

A comparison of experimental annular dark field (ADF)-scanning transmission electron microscopy (STEM) and electron ptychography in uncorrected and aberration-corrected electron microscopes. In the ...

Explore how correlative light and electron microscopy (CLEM) enables high-resolution insights into endocytic sorting.

Scientists have developed a new imaging technique that uses a novel contrast mechanism in bioimaging to merge the strengths of two powerful microscopy methods, allowing researchers to see both the ...