Abstract: This paper presents a detailed analysis of the time dynamics of the gate-induced drain leakage (GIDL)-assisted increase of the string potential in vertical-channel 3-D NAND Flash arrays. The ...
{{ .fieldName }} // Get field from current item +{{ ["field with spaces"] }} // Field names with spaces/special chars +Stop searching through documentation! This ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback