Semiconductor Engineering

Across The Vast Reaches Of The 3D Stack: Mastering ESD Verification In Advanced Semiconductor Design

In the vast reaches of the semiconductor cosmos, a silent menace lurks—one that can obliterate years of design work in a fraction of a nanosecond. Electrostatic discharge (ESD) verification stands as ...
IEEE

Forecasting Precipitation and Temperature Evolution Patterns Under Climate Change Using a Random Forest Approach With Seasonal Bias Correction

Abstract: The accurate prediction of climate patterns is crucial for effective environmental management and strategic planning, particularly in the face of increasing climate variability and extreme ...
IEEE

Joint Use of Architecture Patterns and Safety Case Patterns in the Development of Automotive Systems in Accordance with Functional Safety Standards

Abstract: The paper explores approaches to the joint use of architecture patterns and safety case patterns in the development of automotive systems. Development processes related to "agile" life cycle ...